Investigation of Threshold Ion Range for Accurate Single Event Upset Measurements in Both SOI and Bulk Technologies
2014
期刊
IEEE Transactions on Nuclear Science
作者
Zhangang Zhang
· Jie Liu
· Mingdong Hou
· Song Gu
· Tianqi Liu
· Fazhan Zhao
· Chao Geng
· Kai Xi
· Youmei Sun
· Huijun Yao
· Jie Luo
· Jinglai Duan
· Dan Mo
· Gang Liu
· Zhengsheng Han
· Yunfei En
下载全文
- 卷 61
- 期 3
- 页码 1459-1467
- Institute of Electrical and Electronics Engineers (IEEE)
- ISSN: 0018-9499
- DOI: 10.1109/tns.2014.2325063