Study of the temperature distribution in insulated gate bipolar transistor module under different test conditions

array(2) { ["lab"]=> string(3) "859" ["publication"]=> string(5) "15084" } Study of the temperature distribution in insulated gate bipolar transistor module under different test conditions - Novel Semiconductor Devices and Reliability Lab | LabXing

Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

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2023

期刊 Microelectronics Reliability

作者 Di Zhao · Chunsheng Guo · Yumeng Li · Shijie Pan · Shiwei Feng · Hui Zhu

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卷 140
页码 114880
Elsevier BV
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2022.114880

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