array(2) { ["lab"]=> string(3) "859" ["publication"]=> string(5) "14823" } Effect of Biaxial Bending Strains on the Electrical Characteristics of Flexible Low-Temperature Polysilicon Thin-Film Transistors - Novel Semiconductor Devices and Reliability Lab | LabXing

Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

大学 北京工业大学 / 信息学部
关注
分享到

Effect of Biaxial Bending Strains on the Electrical Characteristics of Flexible Low-Temperature Polysilicon Thin-Film Transistors

2022
期刊 IEEE Transactions on Electron Devices
下载全文
  • 卷 69
  • 期 9
  • 页码 4924-4929
  • Institute of Electrical and Electronics Engineers (IEEE)
  • ISSN: 0018-9383
  • DOI: 10.1109/ted.2022.3192330
LabXing 上可以免费创建课题组网站
© LabXing 2018 关于LabXing 帮助中心 testing.service 京公网安备11010802025734号