Influence of heavy ion flux on single event effect testing in memory devices - 单粒子效应研究组 | LabXing

array(2) { ["lab"]=> string(4) "1176" ["publication"]=> string(4) "9765" } Influence of heavy ion flux on single event effect testing in memory devices - 单粒子效应研究组 | LabXing

单粒子效应研究组

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Influence of heavy ion flux on single event effect testing in memory devices

2017

期刊 Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

作者 Jie Luo · Jie Liu · Youmei Sun · Mingdong Hou · Kai Xi · Tianqi Liu · Bin Wang · Bing Ye

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卷 406
页码 431-436
Elsevier BV
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2017.04.038

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