A numerical calibration of structure-function transient thermal measurement based on Cauer RC network

array(2) { ["lab"]=> string(3) "859" ["publication"]=> string(5) "15328" } A numerical calibration of structure-function transient thermal measurement based on Cauer RC network - Novel Semiconductor Devices and Reliability Lab | LabXing

Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

关注

2023

期刊 Microelectronics Journal

作者 Kun Bai · Shiwei Feng · Xuan Li · Shijie Pan · Xiaozhuang Lu · Zhihong Feng · Yamin Zhang

下载全文

页码 105742
Elsevier BV
ISSN: 0026-2692
DOI: 10.1016/j.mejo.2023.105742

LabXing 上可以免费创建课题组网站