Impact of energy straggle on proton-induced single event upset test in a 65-nm SRAM cell - 单粒子效应研究组 | LabXing

array(2) { ["lab"]=> string(4) "1176" ["publication"]=> string(4) "9770" } Impact of energy straggle on proton-induced single event upset test in a 65-nm SRAM cell - 单粒子效应研究组 | LabXing

单粒子效应研究组

简介

关注

Impact of energy straggle on proton-induced single event upset test in a 65-nm SRAM cell

2017

期刊 Chinese Physics B

作者 Bing Ye · Jie Liu · Tie-Shan Wang · Tian-Qi Liu · Jie Luo · Bin Wang · Ya-Nan Yin · Qing-Gang Ji · Pei-Pei Hu · You-Mei Sun · Ming-Dong Hou

下载全文

卷 26
期 8
页码 088501
IOP Publishing
ISSN: 1674-1056
DOI: 10.1088/1674-1056/26/8/088501

LabXing 上可以免费创建课题组网站