Application of SEU imaging for analysis of device architecture using a 25 MeV/u 86 Kr ion microbeam at HIRFL
2017
期刊
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
作者
Tianqi Liu
· Zhenlei Yang
· Jinlong Guo
· Guanghua Du
· Teng Tong
· Xiaohui Wang
· Hong Su
· Wenjing Liu
· Jiande Liu
· Bin Wang
· Bing Ye
· Jie Liu
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- 卷 404
- 页码 254-258
- Elsevier BV
- ISSN: 0168-583X
- DOI: 10.1016/j.nimb.2017.01.069