Heavy-ion and pulsed-laser single event effects in 130-nm CMOS-based thin/thick gate oxide anti-fuse PROMs
2019
期刊
Nuclear Science and Techniques
作者
Chang Cai
· Tian-Qi Liu
· Xiao-Yuan Li
· Jie Liu
· Zhan-Gang Zhang
· Chao Geng
· Pei-Xiong Zhao
· Dong-Qing Li
· Bing Ye
· Qing-Gang Ji
· Li-Hua Mo
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- 卷 30
- 期 5
- Springer Science and Business Media LLC
- ISSN: 1001-8042
- DOI: 10.1007/s41365-019-0602-6