array(2) { ["lab"]=> string(3) "859" ["research"]=> string(4) "1099" } 钙钛矿型铁酸铋BiFeO3薄膜铁电特性和极化疲劳 - Novel Semiconductor Devices and Reliability Lab | LabXing

Novel Semiconductor Devices and Reliability Lab

A semiconductor group in BJUT

北京工业大学 / 信息学部

钙钛矿型铁酸铋BiFeO3薄膜铁电特性和极化疲劳

 

 

创建: Jul 27, 2019 | 20:27