A new method for detecting thermal characteristics of slow-wave structure of helix traveling-wave tube using external heat source

array(2) { ["lab"]=> string(3) "859" ["publication"]=> string(4) "7942" } A new method for detecting thermal characteristics of slow-wave structure of helix traveling-wave tube using external heat source - Novel Semiconductor Devices and Reliability Lab | LabXing

Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

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2019

期刊 Review of Scientific Instruments

作者 X. He · S. W. Feng · F. Yang · Y. M. Zhang

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卷 90
期 9
页码 094702
AIP Publishing
ISSN: 0034-6748
DOI: 10.1063/1.5102130

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