array(2) { ["lab"]=> string(3) "859" ["publication"]=> string(4) "7941" } A New Method for Measuring Thermal Characteristics of Multistage Depressed Collectors - Novel Semiconductor Devices and Reliability Lab | LabXing

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A New Method for Measuring Thermal Characteristics of Multistage Depressed Collectors

2019
期刊 IEEE Transactions on Electron Devices
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  • 卷 66
  • 期 12
  • 页码 5404-5406
  • Institute of Electrical and Electronics Engineers (IEEE)
  • ISSN: 0018-9383
  • DOI: 10.1109/ted.2019.2947423
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