array(2) { ["lab"]=> string(3) "859" ["publication"]=> string(4) "6278" } Thermal Analysis of GaAs-Based High Power Laser Diodes Related to Degradation - Novel Semiconductor Devices and Reliability Lab | LabXing

Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

大学 北京工业大学 / 信息学部
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Thermal Analysis of GaAs-Based High Power Laser Diodes Related to Degradation

2011
会议 2011 Symposium on Photonics and Optoelectronics (SOPO)
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