All-digital thermal distribution measurement on field programmable gate array using ring oscillators

array(2) { ["lab"]=> string(3) "859" ["publication"]=> string(4) "6244" } All-digital thermal distribution measurement on field programmable gate array using ring oscillators - Novel Semiconductor Devices and Reliability Lab | LabXing

Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

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2015

期刊 Microelectronics Reliability

作者 Yuan Yue · Shi-Wei Feng · Chun-Sheng Guo · Xin Yan · Rui-Rui Feng

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卷 55
期 2
页码 396-401
Elsevier BV
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2014.10.010

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