Research on Transient Temperature Rise Measurement Method for Semiconductor Devices Based on Photothermal Reflection - Novel Semiconductor Devices and Reliability Lab | LabXing

array(2) { ["lab"]=> string(3) "859" ["publication"]=> string(5) "15319" } Research on Transient Temperature Rise Measurement Method for Semiconductor Devices Based on Photothermal Reflection - Novel Semiconductor Devices and Reliability Lab | LabXing

Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

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Research on Transient Temperature Rise Measurement Method for Semiconductor Devices Based on Photothermal Reflection

2023

期刊 IEEE Transactions on Instrumentation and Measurement

作者 Xianwei Meng · Meng Zhang · Kun Duan · Xiang Zheng · Yuwei Zhai · Shiwei Feng · Yamin Zhang

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卷 72
页码 1-9
Institute of Electrical and Electronics Engineers (IEEE)
ISSN: 0018-9456
DOI: 10.1109/tim.2023.3239625

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