Characterization of Heavy Ion Induced SET Features in 22-nm FD-SOI Testing Circuits - 单粒子效应研究组 | LabXing

array(2) { ["lab"]=> string(4) "1176" ["publication"]=> string(4) "9750" } Characterization of Heavy Ion Induced SET Features in 22-nm FD-SOI Testing Circuits - 单粒子效应研究组 | LabXing

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Characterization of Heavy Ion Induced SET Features in 22-nm FD-SOI Testing Circuits

2020

期刊 IEEE Access

作者 Chang Cai · Ze He · Tianqi Liu · Gengsheng Chen · Jian Yu · Liewei Xu · Jie Liu

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卷 8
页码 45378-45389
Institute of Electrical and Electronics Engineers (IEEE)
ISSN: 2169-3536
DOI: 10.1109/access.2020.2978201

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