Large-tilt Heavy Ions Induced SEU in Multiple Radiation Hardened 22 nm FDSOI SRAMs
2020
会议
2020 IEEE International Reliability Physics Symposium (IRPS)
作者
Chang Cai
· Tianqi Liu
· Jie Liu
· Gengsheng Chen
· Luchang Ding
· Kai Zhao
· Bingxu Ning
· Mingjie Shen
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- IEEE
- ISBN: 9781728131993
- DOI: 10.1109/irps45951.2020.9128357