#Yerong Sun

Strain distribution and electrical characteristics of flexible low-temperature polysilicon thin film transistors under biaxial bending

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Effects of Static and Repetitive Uniaxial Bending Strains on the Electrical Properties and Trap Characteristics of Flexible Low-Temperature Polysilicon Thin-Film Transistors

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

Trap characteristics of hafnium oxide-based ferroelectric field-effect transistors measured by using a current transient method

Novel Semiconductor Devices and Reliability Lab , 北京工业大学

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