Thermal analysis in high power GaAs-based laser diodes

array(2) { ["lab"]=> string(3) "859" ["publication"]=> string(4) "6276" } Thermal analysis in high power GaAs-based laser diodes - Novel Semiconductor Devices and Reliability Lab | LabXing

Novel Semiconductor Devices and Reliability Lab

简介 A semiconductor group in BJUT

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2016

期刊 Journal of Semiconductors

作者 Xueqin Gong · Shiwei Feng · Yuan Yue · Junwei Yang · Jingwei Li

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卷 37
期 4
页码 044011
IOP Publishing
ISSN: 1674-4926
DOI: 10.1088/1674-4926/37/4/044011

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