mEosEM withstands osmium staining and Epon embedding for super-resolution CLEM - 付志飞实验室-超分辨光电关联成像 | LabXing

array(2) { ["lab"]=> string(4) "1688" ["publication"]=> string(5) "15270" } mEosEM withstands osmium staining and Epon embedding for super-resolution CLEM - 付志飞实验室-超分辨光电关联成像 | LabXing

付志飞实验室-超分辨光电关联成像

简介专注于超分辨光电关联成像技术的开发和应用

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mEosEM withstands osmium staining and Epon embedding for super-resolution CLEM

2019

期刊 Nature Methods

作者 Zhifei Fu · Dingming Peng · Mingshu Zhang · Fudong Xue · Rui Zhang · Wenting He · Tao Xu · Pingyong Xu

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卷 17
期 1
页码 55-58
Springer Science and Business Media LLC
ISSN: 1548-7091
DOI: 10.1038/s41592-019-0613-6

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