Ab Initio Investigation of Charge Trapping Across the Crystalline- Si –Amorphous- SiO2 Interface

array(2) { ["lab"]=> string(4) "1424" ["publication"]=> string(5) "13014" } Ab Initio Investigation of Charge Trapping Across the Crystalline- Si –Amorphous- SiO2 Interface - Computational Material Science Group | LabXing

Computational Material Science Group

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2019

期刊 Physical Review Applied

作者 Yue-Yang Liu · Fan Zheng · Xiangwei Jiang · Jun-Wei Luo · Shu-Shen Li · Lin-Wang Wang

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卷 11
期 4
American Physical Society (APS)
ISSN: 2331-7019
DOI: 10.1103/physrevapplied.11.044058

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